Analytical Tools Empowering Research<\/p>\n<\/div>
Delivering Value<\/h1><\/div>How we work<\/span><\/a><\/div><\/div><\/div><\/div><\/div><\/span><\/a><\/span><\/i>EXPLORE OUR PRODUCTS<\/p>\n<\/div><\/div><\/div><\/span><\/a><\/span><\/i>EXPLORE OUR SERVICES<\/p>\n<\/div><\/div><\/div><\/span><\/a><\/span><\/i>EXPLORE OUR ENDEAVOURS<\/p>\n<\/div><\/div><\/div><\/div><\/div>![](\"https:\/\/www.phi-gmbh.eu\/wp-content\/uploads\/2022\/12\/GF_sw_Filter-gold.jpg\" "\\"GF_sw_Filter-gold\\"")
<\/span><\/div><\/div><\/div>25+ YEARS OF EXPERIENCE<\/strong><\/p>\n<\/div>Trustful Partnership<\/h2><\/div>The starting signal for Physical Electronics GmbH in its present form was given in 2004. However, our history goes back to the beginnings of surface analysis in the early 70s. Since that time, we have focused on the added value for our customers.<\/p>\n
Trust is the foundation of our corporate culture and also of any long-term business relationship. We have been active as a service provider in Germany, Austria and Switzerland for many years and serve customers from all areas of research and industry. With many of these customers, we maintain business relationships that have lasted for decades. We want to further strengthen this foundation and are continuously working to improve ourselves. Feedback from our partners and customers is important to us, and we regularly reflect on whether we are fulfilling the demands of our partners, customers and ourselves.<\/p>\n
Our structures are lean and optimized for effectiveness and efficiency. This allows us to react quickly to trends and markets. Our departments are closely interlinked and allow us a broad view of customer needs and market developments. We look to the future without forgetting the past.<\/p>\n<\/div>
<\/div><\/i> LEARN MORE ABOUT US<\/strong><\/a><\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div>Characterisation of
\nsurfaces<\/strong><\/p>\n<\/div>Surface
\nAnalysis<\/p><\/h2><\/div>
Understanding surfaces, layer systems and their interfaces<\/p>\n<\/div>
- <\/i><\/span>\n
Photoelectron spectroscopy XPS<\/a><\/p>\n<\/div><\/li>- <\/i><\/span>\n
Time-of-flight mass spectrometry ToF-SIMS<\/a><\/p>\n<\/div><\/li>- <\/i><\/span>Auger electron spectroscopy AES<\/a><\/div><\/li><\/ul><\/i>Show Details for Method<\/span><\/a><\/div><\/div><\/div>
Non-destructive component characterisation<\/strong><\/p>\n<\/div>3D computed tomography<\/h2><\/div>Non-destructive view into complex components. Measure hidden structures and determine porosity.<\/p>\n<\/div>
- <\/i><\/span>\n
Stand alone systems<\/a><\/p>\n<\/div><\/li>- <\/i><\/span>\n
Benchtop systems<\/a><\/p>\n<\/div><\/li><\/ul><\/i>Show Details for Method<\/span><\/a><\/div><\/div><\/div>Measuring surfaces<\/strong><\/p>\n<\/div><\/div>Atomic force microscopy<\/h2><\/div>Nanometre-precise imaging of the surface<\/p>\n<\/div>
- <\/i><\/span>\n
Stand alone systems<\/a><\/p>\n<\/div><\/li>- <\/i><\/span>\n
SEM Extension<\/a><\/p>\n<\/div><\/li><\/ul><\/i>Show Details for Method<\/span><\/a><\/div><\/div><\/div>![\"A](\"https:\/\/www.phi-gmbh.eu\/wp-content\/uploads\/2022\/07\/Kachel-1.jpg\" "\\"Kachel-1\\"")
<\/span><\/div><\/div><\/div>![\"A](\"https:\/\/www.phi-gmbh.eu\/wp-content\/uploads\/2022\/07\/Kachel-2.jpg\" "\\"Kachel-2\\"")
<\/span><\/div><\/div><\/div>![\"Metallic](\"https:\/\/www.phi-gmbh.eu\/wp-content\/uploads\/2022\/07\/Kachel-3.jpg\" "\\"Kachel-3\\"")
<\/span><\/div><\/div><\/div><\/div><\/div>Imaging Techniques<\/strong><\/p>\n<\/div><\/div>Electron Microscopy<\/h2><\/div>High-resolution imaging instruments<\/p>\n<\/div>
- <\/i><\/span>\n
Low-Voltage Transmission Electron Microscopy<\/a><\/p>\n<\/div><\/li>- <\/i><\/span>\n
SEM Extension<\/a><\/p>\n<\/div><\/li><\/ul><\/i>Show Details for Method<\/span><\/a><\/div><\/div><\/div>Spectroscopy and
\nChromatography<\/strong><\/p>\n<\/div>Instrumental analysis<\/h2><\/div>Understanding the chemical composition of materials<\/p>\n<\/div>
- <\/i><\/span>\n
<\/i>EXPLORE OUR PRODUCTS<\/p>\n<\/div><\/div><\/div> <\/i>EXPLORE OUR SERVICES<\/p>\n<\/div><\/div><\/div> <\/i>EXPLORE OUR ENDEAVOURS<\/p>\n<\/div><\/div><\/div><\/div><\/div> 25+ YEARS OF EXPERIENCE<\/strong><\/p>\n<\/div> The starting signal for Physical Electronics GmbH in its present form was given in 2004. However, our history goes back to the beginnings of surface analysis in the early 70s. Since that time, we have focused on the added value for our customers.<\/p>\n Trust is the foundation of our corporate culture and also of any long-term business relationship. We have been active as a service provider in Germany, Austria and Switzerland for many years and serve customers from all areas of research and industry. With many of these customers, we maintain business relationships that have lasted for decades. We want to further strengthen this foundation and are continuously working to improve ourselves. Feedback from our partners and customers is important to us, and we regularly reflect on whether we are fulfilling the demands of our partners, customers and ourselves.<\/p>\n Our structures are lean and optimized for effectiveness and efficiency. This allows us to react quickly to trends and markets. Our departments are closely interlinked and allow us a broad view of customer needs and market developments. We look to the future without forgetting the past.<\/p>\n<\/div> <\/i> LEARN MORE ABOUT US<\/strong><\/a><\/p>\n<\/div><\/div><\/div><\/div><\/div> Characterisation of Surface Understanding surfaces, layer systems and their interfaces<\/p>\n<\/div> Photoelectron spectroscopy XPS<\/a><\/p>\n<\/div><\/li> Time-of-flight mass spectrometry ToF-SIMS<\/a><\/p>\n<\/div><\/li> Non-destructive component characterisation<\/strong><\/p>\n<\/div> Non-destructive view into complex components. Measure hidden structures and determine porosity.<\/p>\n<\/div> Stand alone systems<\/a><\/p>\n<\/div><\/li> Benchtop systems<\/a><\/p>\n<\/div><\/li><\/ul> Measuring surfaces<\/strong><\/p>\n<\/div> Nanometre-precise imaging of the surface<\/p>\n<\/div> Stand alone systems<\/a><\/p>\n<\/div><\/li> SEM Extension<\/a><\/p>\n<\/div><\/li><\/ul> Imaging Techniques<\/strong><\/p>\n<\/div> High-resolution imaging instruments<\/p>\n<\/div> Low-Voltage Transmission Electron Microscopy<\/a><\/p>\n<\/div><\/li> SEM Extension<\/a><\/p>\n<\/div><\/li><\/ul> Spectroscopy and Understanding the chemical composition of materials<\/p>\n<\/div><\/span><\/div><\/div><\/div>Trustful Partnership<\/h2><\/div>
\nsurfaces<\/strong><\/p>\n<\/div>
\nAnalysis<\/p><\/h2><\/div>3D computed tomography<\/h2><\/div>
Atomic force microscopy<\/h2><\/div>
<\/span><\/div><\/div><\/div><\/span><\/div><\/div><\/div><\/span><\/div><\/div><\/div><\/div><\/div>Electron Microscopy<\/h2><\/div>
\nChromatography<\/strong><\/p>\n<\/div>Instrumental analysis<\/h2><\/div>
![](\"https:\/\/www.phi-gmbh.eu\/wp-content\/uploads\/2023\/05\/Kachel-4.jpg\" "\\"Kachel-4\\"")
<\/span><\/div><\/div><\/div>![\"chemistry](\"https:\/\/www.phi-gmbh.eu\/wp-content\/uploads\/2022\/07\/Kachel-5.jpg\" "\\"Kachel-5\\"")
<\/span><\/div><\/div><\/div>![\"Two](\"https:\/\/www.phi-gmbh.eu\/wp-content\/uploads\/2022\/07\/Kachel-6.jpg\" "\\"Kachel-6\\"")
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