{"id":10884,"date":"2025-08-12T14:33:54","date_gmt":"2025-08-12T12:33:54","guid":{"rendered":"https:\/\/www.phi-gmbh.eu\/?p=10884"},"modified":"2025-08-12T14:33:54","modified_gmt":"2025-08-12T12:33:54","slug":"exclusive-nenovision-workshop-at-ikts-dresden-2","status":"publish","type":"post","link":"https:\/\/www.phi-gmbh.eu\/de\/exclusive-nenovision-workshop-at-ikts-dresden-2\/","title":{"rendered":"Exklusiver NenoVision-Workshop am IKTS Dresden"},"content":{"rendered":"

Exklusiver Workshop am IKTS Dresden – 11. September 2025<\/h5>\n<\/div>

\u201eLiteScope AFM-in-SEM: Neue Ma\u00dfst\u00e4be in der Halbleiterfehleranalyse und Materialcharakterisierung\u201c<\/h2>\n<\/div>
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Die Agenda finden Sie hier<\/span><\/a><\/div><\/div><\/div>

Wir freuen uns, Sie zu unserem kommenden Workshop „LiteScope AFM-in-SEM: Neue Ma\u00dfst\u00e4be in der Halbleiterfehleranalyse und Materialcharakterisierung“<\/strong>\u00a0einladen zu d\u00fcrfen.<\/p>\n

Bitte beachten Sie, dass die Anzahl der Teilnehmer auf 25 begrenzt ist.<\/p>\n<\/div>

Hier anmelden<\/span><\/a><\/div>
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LiteScope is an innovative AFM-in-SEM tool, built for researchers pushing the limits of material science. Through its correlative CPEM mode, it enables simultaneous acquisition of morphological, electrical, mechanical, and magnetic data, directly inside your existing SEM environment.\u200b<\/p>\n

Designed for both academic labs and industrial R&D, LiteScope enhances existing workflows while revealing hidden behaviours in devices and materials, previously impossible to discover with traditional tools. From failure analysis of semiconductor devices to battery materials characterisation, LiteScope AFM-in-SEM continues to reveal what others can\u2019t.\u200b<\/p>\n<\/div><\/div><\/div><\/div><\/div>

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Warum lohnt sich Ihre Teilnahme?<\/p>\n<\/div>