March 15th, 2023<\/b><\/h5>\n<\/div>AFM-in-SEM – Your analytical benefits in the semiconductor industry<\/h2>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div>![](\"https:\/\/www.phi-gmbh.eu\/wp-content\/uploads\/2023\/02\/Webinar._swjpg.jpg\" "\\"Webinar._swjpg\\"")
<\/span><\/div><\/div><\/div>We invite you to join the next NanoX-Change webinar.<\/p>\n
Our speaker Jens Niemann will take you into the world of AFM-in-SEM and answer the following questions:<\/p>\n
\n- For which basic application areas does the LiteScope\u2122 achieve outstanding results?<\/li>\n
- \u00a0What are the main benefits of the AFM-in-SEM approach for you as a user?<\/li>\n
- \u00a0How can the LiteScope\u2122 help in defect or failure analysis in semiconductor industry?<\/li>\n<\/ul>\n
The expected duration is about 45 minutes. Invitations with the link to the live streaming will be sent after registration. The webinar is completely free of charge.<\/p>\n<\/div>
<\/div>Tick... tick... tick...<\/div><\/div>0<\/div>0<\/div>0<\/div>0<\/div><\/div>Days<\/div><\/div><\/div>0<\/div>0<\/div><\/div>Hrs<\/div><\/div><\/div>0<\/div>0<\/div><\/div>Min<\/div><\/div><\/div>0<\/div>0<\/div><\/div>Sec<\/div><\/div><\/div><\/div><\/div><\/div>LiteScope\u2122 is a unique AFM designed to integrate with SEMs. Thanks to this combination, it enables precise and time-efficient complex in situ analyses where AFM and SEM measurements are performed at the same time, in the same place and under the same conditions in the SEM, avoiding the risk of contamination during sample transfer between SEM and AFM. It also allows simultaneous acquisition of different types of signals, making it possible to perform complex measurements of samples.<\/p>\n
We look forward to seeing you on March 15th!<\/p>\n<\/div><\/div><\/div><\/div><\/div>
Grab your spot here & now<\/p><\/h2><\/div>
AFM-in-SEM – Your analytical benefits in the semiconductor industry<\/h2>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/span><\/div><\/div><\/div>We invite you to join the next NanoX-Change webinar.<\/p>\n
Our speaker Jens Niemann will take you into the world of AFM-in-SEM and answer the following questions:<\/p>\n
\n- For which basic application areas does the LiteScope\u2122 achieve outstanding results?<\/li>\n
- \u00a0What are the main benefits of the AFM-in-SEM approach for you as a user?<\/li>\n
- \u00a0How can the LiteScope\u2122 help in defect or failure analysis in semiconductor industry?<\/li>\n<\/ul>\n
The expected duration is about 45 minutes. Invitations with the link to the live streaming will be sent after registration. The webinar is completely free of charge.<\/p>\n<\/div>
<\/div>Tick... tick... tick...<\/div><\/div>0<\/div>0<\/div>0<\/div>0<\/div><\/div>Days<\/div><\/div><\/div>0<\/div>0<\/div><\/div>Hrs<\/div><\/div><\/div>0<\/div>0<\/div><\/div>Min<\/div><\/div><\/div>0<\/div>0<\/div><\/div>Sec<\/div><\/div><\/div><\/div><\/div><\/div>LiteScope\u2122 is a unique AFM designed to integrate with SEMs. Thanks to this combination, it enables precise and time-efficient complex in situ analyses where AFM and SEM measurements are performed at the same time, in the same place and under the same conditions in the SEM, avoiding the risk of contamination during sample transfer between SEM and AFM. It also allows simultaneous acquisition of different types of signals, making it possible to perform complex measurements of samples.<\/p>\n
We look forward to seeing you on March 15th!<\/p>\n<\/div><\/div><\/div><\/div><\/div>
Grab your spot here & now<\/p><\/h2><\/div>
<\/span><\/div><\/div><\/div>We invite you to join the next NanoX-Change webinar.<\/p>\n
Our speaker Jens Niemann will take you into the world of AFM-in-SEM and answer the following questions:<\/p>\n
- \n
- For which basic application areas does the LiteScope\u2122 achieve outstanding results?<\/li>\n
- \u00a0What are the main benefits of the AFM-in-SEM approach for you as a user?<\/li>\n
- \u00a0How can the LiteScope\u2122 help in defect or failure analysis in semiconductor industry?<\/li>\n<\/ul>\n
The expected duration is about 45 minutes. Invitations with the link to the live streaming will be sent after registration. The webinar is completely free of charge.<\/p>\n<\/div>
<\/div>Tick... tick... tick...<\/div><\/div>0<\/div>0<\/div>0<\/div>0<\/div><\/div>Days<\/div><\/div><\/div>0<\/div>0<\/div><\/div>Hrs<\/div><\/div><\/div>0<\/div>0<\/div><\/div>Min<\/div><\/div><\/div>0<\/div>0<\/div><\/div>Sec<\/div><\/div><\/div><\/div><\/div><\/div>LiteScope\u2122 is a unique AFM designed to integrate with SEMs. Thanks to this combination, it enables precise and time-efficient complex in situ analyses where AFM and SEM measurements are performed at the same time, in the same place and under the same conditions in the SEM, avoiding the risk of contamination during sample transfer between SEM and AFM. It also allows simultaneous acquisition of different types of signals, making it possible to perform complex measurements of samples.<\/p>\n
We look forward to seeing you on March 15th!<\/p>\n<\/div><\/div><\/div><\/div><\/div>
Grab your spot here & now<\/p><\/h2><\/div>