Exclusive Auger User Workshop at TU Wien – 16 October 2025
Experience Auger spectroscopy up close – Auger insights & hands-on training
We would very much like you and your group of experts in this field to join us in our efforts to build a European Auger community, strengthen collaborations, and encourage the sharing of skills in order to improve the quality of research in this area.
The morning will be devoted to theoretical lectures and discussions, while the afternoon will focus on practical issues such as sample preparation, equipment handling and measurement setup (designed by experts from the Physical Electronics family). The entire workshop will, of course, be accompanied by a culinary and cultural journey through Vienna’s treasures – including beer and wine.
The workshop is free of charge; participants are responsible for their own accommodation and travel expenses.
Take advantage of the opportunity to give a short presentation (15 minutes + 5 minutes discussion) on your current research – ideally related to Auger spectroscopy. Please feel free to contact us.
We look forward to welcoming you in Vienna.
Organiser
Physical Electronics GmbH
In cooperation with the Analytical Instrumentation Centre AIC at TU Wien
Venue
Analytical Instrumentation Centre AIC at TU Wien

Why attend?
Grab your spot here & now

Analytical Instrumentation Centre AIC at TU Wien
The Analytical Instrumentation Centre (AIC) at TU Wien is a service core facility of the university that enables researchers from a wide range of disciplines (physics, engineering, life sciences, etc.) to perform state-of-the-art characterisation of the species present on sample surfaces. The team of service scientists at the AIC carries out measurements and data analysis, and also offers equipment training and cooperation at various levels. In addition, we provide and continuously improve an infrastructure that allows measurements to be carried out to the highest possible quality standards. The list of equipment available through the centre is extensive; our current focus is on XPS, Auger spectroscopy, ToF-SIMS and LEIS.
Auger Electron Spectroscopy (AES)
Auger Electron Spectroscopy (AES) extracts quantitative elemental and chemical state information from solid material surfaces. An AES measurement’s average depth of analysis is about 5 nm. Physical Electronics Auger instruments can generate spectra with lateral spatial resolutions as low as 8 nm. Scanning the micro-focused electron beam across the spatial distribution, information is obtained.