Surface Analysis – Physical Electronics

PHI Genesis

PHI nano TOF 3

PHI 710 Scanning Auger Nanoprobe

3D Computed Tomography – Benchtop Systems – Neoscan

NeoScan N80, N70, N60

3D Computed Tomography – Stand Alone Systems – RX Solutions

EasyTom

EasyTom S

EasyTom XL

Atomic Force Microscopy – Stand alone systems – ICSPI

ICSPI nGauge AFM

RP ICSPI Redux

ICSPI Redux AFM

RP ICSPI Vertex

ICSPI Vertex AFM

Atomic Force Microscopy – SEM Extension – Nenovision

AFM-in-SEM

Electron Microscopy – Low-Voltage Transmission Electron Microscopy – Delong Instruments

LVEM 5

LVEM 25E

Instrumental Analysis – Raman spectroscopy – Timegate

PicoRaman M3

Instrumental Analysis – Preparative HPLC/GPC – Japan Analytical Industry (JAI)

Recycling Preparative HPLC LaboACE LC-5060 PlusII

Recycling Preparative HPLC LaboACE LC-7080 Plus

Curie Point Injector JCI-77

Hybrid Pyrolyzer JHI-08

Instrumental Analysis – LIBS – Lightigo

FireFly