Mixed Reality – A New Service Offering
The use of Mixed Reality is a revolutionary step forward for us and our customers.
Find out why...
Semiconductor Industry: Failure analysis of bipolar junction transistors (BJTs)
Are you working in the semiconductor industry and looking for insights into the factors that lead to Bipolar Junction Transistor (BJT) failures? Read more...
Exploring the Power of X-Ray Computed Tomography for Defect Analysis
X-Ray Computed Tomography for Defect Analysis
Are your products free of defects? Yes! Are you sure of that? Let's X-ray...
Exploring cell biology with transmission electron microscopy (TEM)
Transmission electron microscopy (TEM) has become an indispensable tool for studying cells and their components at the ultrastructural level. Want to know more? Read here...
University of Ulm receives second GPC instrument
Today we had the pleasure to install the second HPLC recycling instrument LaboACE LC-7080 Plus - AUTOMATED from our valued partner JAI (Japan Analytical Industry Co., Ltd.) at the University of Ulm. Find out why our customer is so happy with the JAI instrument...
Meet us here – SMT35 Hamburg
September 18th - 22nd, 2023 –
Meet us at SMT35 Hamburg, Germany
Detection of Cadmium in Sinapis Alba with LIBS
Do you want to know to what extent toxic substances are taken up by plants?
We show you the detection and distribution of cadmium in Sinapis Alba (white mustard plant) using LIBS.
Read this interesting story...
NanoX-Pert Seminar October 17th, 2023
October 17th, 2023 - 9 am to 5 pm
Focus: Surface analytics for defect analysis
New partnership with Delong Instruments
We are delighted to announce our new partnership with Delong Instruments. We have added transmission electron microscopes to our portfolio to give you even more options to solve your challenges. What is the added value for you? Read more...
LiteScope 2.5 available now
Here is the new AFM LiteScope 2.5 from NenoVision, with new electronic control, revised software (e.g. with AI-based image processing algorithm), added secondary electrical modes...
