Meet us here – AOFKA2025
Meet us at the conference "Applied Surface and Solid State Analysis" - June 30 - July 02, 2025
Subnanometer accuracy for the chip industry: TOF-SIMS in focus
TOF-SIMS tandem MS imaging provides 3D insights at the sub-nanometer level – for better processes and more reliable chips.
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Efficient NAND analysis with AFM-in-SEM
NAND error analysis with in-situ delayering and C-AFM measurement.
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HAXPES WORKSHOP Empa Akademie
You want to learn the fundamentals and applications of Hard X-ray Photoelectron Spectroscopy (HAXPES)?
Visit this workshop ...
Low Voltage Electron Microscopy for Imaging of Biological Thin Sections
hink high-resolution imaging of biological thin sections must mean a high-voltage TEM?
Think again! ...
state-of-the-art CT technology
X-rayed down to the last detail: How computer tomography reveals the secret of the pearl boat
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NanoX-Pert Seminar June 3rd, 2025
June 3rd, 2025 - 9 am to 4:30 pm
Focus: Expansion of our surface analysis expertise
Meet us here – Swiss NanoConvention
Meet us at the Swiss NanoConvention - June 12-13, 2025
Meet us here – Microscopy Conference MC 2025
Meet us at the MC25 in Karlsruhe, Germany - 31 Aug - 4 Sept 2025
Meet us here – Control 2025
Meet us at Control, Stuttgart, Germany - May 6-9, 2025
