PHI’s nanoTOF 3 is the most recent generation of TOF-SIMS instruments. The patented parallel Imaging MS/MS and the TRIFT Analyzer, two major characteristics, enable TOF-SIMS on highly topographical surfaces, high mass accuracy, high mass resolution, and unambiguous peak identification with parallel tandem MS imaging.
It has a wide range of options for optimizing performance for both organic and inorganic materials.
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) provides elemental, chemical state, and molecular information from surfaces of solid materials. The average depth of analysis for a TOF-SIMS measurement is approximately 1 nm.