Exclusive Auger User Workshop at TU Wien
16 October 2025 AIC (Analytical Instrumentation Centre) at TU Wien, Austria
Exclusive NenoVision Workshop at IKTS Dresden
11 September 2025 Fraunhofer Institute for Ceramic Technologies and Systems IKTS, Dresden, Germany
Meet us here – AOFKA2025
Meet us at the conference "Applied Surface and Solid State Analysis" - June 30 - July 02, 2025
Subnanometer accuracy for the chip industry: TOF-SIMS in focus
TOF-SIMS tandem MS imaging provides 3D insights at the sub-nanometer level – for better processes and more reliable chips.
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Efficient NAND analysis with AFM-in-SEM
NAND error analysis with in-situ delayering and C-AFM measurement.
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HAXPES WORKSHOP Empa Akademie
You want to learn the fundamentals and applications of Hard X-ray Photoelectron Spectroscopy (HAXPES)?
Visit this workshop ...
Low Voltage Electron Microscopy for Imaging of Biological Thin Sections
hink high-resolution imaging of biological thin sections must mean a high-voltage TEM?
Think again! ...
state-of-the-art CT technology
X-rayed down to the last detail: How computer tomography reveals the secret of the pearl boat
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NanoX-Pert Seminar June 3rd, 2025
June 3rd, 2025 - 9 am to 4:30 pm
Focus: Expansion of our surface analysis expertise
Meet us here – Swiss NanoConvention
Meet us at the Swiss NanoConvention - June 12-13, 2025
