LATEST NEWS ABOUT PRODUCTS AND CASE STUDIES
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Here you get a deeper insight into our techniques and applications. We prepare case studies, customer reports and presentations for you and inform about news and events. Stay in the loop!
From manual to autonomous – Sample loader for your CT system
Automate your CT system in 24/7 mode with the RX Sample Loader.
Explore the possibilities ...
Subnanometer accuracy for the chip industry: TOF-SIMS in focus
TOF-SIMS tandem MS imaging provides 3D insights at the sub-nanometer level – for better processes and more reliable chips.
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Efficient NAND analysis with AFM-in-SEM
NAND error analysis with in-situ delayering and C-AFM measurement.
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Low Voltage Electron Microscopy for Imaging of Biological Thin Sections
hink high-resolution imaging of biological thin sections must mean a high-voltage TEM?
Think again! ...
state-of-the-art CT technology
X-rayed down to the last detail: How computer tomography reveals the secret of the pearl boat
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Lithium in concrete: How LIBS technology is revolutionising material analysis
LIBS is a powerful method for detecting lithium in concrete quickly and accurately.Learn more about...
Dr Daniela Rascher to join the management team of PHI GmbH
#PEOPLEMATTER Since joining the company in 2015, Dr Rascher has made a significant contribution to the development and success of the sales team.
Get to know her...
HZB – New standards in battery research
How the Helmholtz-Zentrum Berlin's RX instruments are setting new standards in battery researchRead more...
Recycling Reinvented: How Science is Transforming Textile Waste
How to How to Simplify Sorting, Ensure Quality, Optimize Additives, Create Eco-Friendly Fashion and more...
Innovation for nanoparticle analysis and more
Compact and versatile TEM instruments are revolutionising research and industry
Learn how...
