March 15th, 2023
AFM-in-SEM – Your analytical benefits in the semiconductor industry
We invite you to join the next NanoX-Change webinar.
Our speaker Jens Niemann will take you into the world of AFM-in-SEM and answer the following questions:
- For which basic application areas does the LiteScope™ achieve outstanding results?
- What are the main benefits of the AFM-in-SEM approach for you as a user?
- How can the LiteScope™ help in defect or failure analysis in semiconductor industry?
The expected duration is about 45 minutes. Invitations with the link to the live streaming will be sent after registration. The webinar is completely free of charge.
LiteScope™ is a unique AFM designed to integrate with SEMs. Thanks to this combination, it enables precise and time-efficient complex in situ analyses where AFM and SEM measurements are performed at the same time, in the same place and under the same conditions in the SEM, avoiding the risk of contamination during sample transfer between SEM and AFM. It also allows simultaneous acquisition of different types of signals, making it possible to perform complex measurements of samples.
We look forward to seeing you on March 15th!