Subnanometer accuracy for the chip industry: TOF-SIMS in focus
TOF-SIMS tandem MS imaging provides 3D insights at the sub-nanometer level – for better processes and more reliable chips.
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Dr Daniela Rascher to join the management team of PHI GmbH
#PEOPLEMATTER Since joining the company in 2015, Dr Rascher has made a significant contribution to the development and success of the sales team.
Get to know her...
Innovation for nanoparticle analysis and more
Compact and versatile TEM instruments are revolutionising research and industry
Learn how...
Successful Installation of the HPLC LaboACE LC-5060 Plus II at the University of Freiburg
Successful Installation of the HPLC LaboACE LC-5060 Plus II
Introduction N90
NEOSCAN introduces the N90, the world's first benchtop nano-tomography system.
Discover now...
Launch of the EasyTom-L
RX Solutions unveils a new X-ray CT scanner combining versatility and high performance in a compact cabinet: the EasyTom-L.
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Mixed Reality – A New Service Offering
The use of Mixed Reality is a revolutionary step forward for us and our customers.
Find out why...
New partnership with Delong Instruments
We are delighted to announce our new partnership with Delong Instruments. We have added transmission electron microscopes to our portfolio to give you even more options to solve your challenges. What is the added value for you? Read more...
LiteScope 2.5 available now
Here is the new AFM LiteScope 2.5 from NenoVision, with new electronic control, revised software (e.g. with AI-based image processing algorithm), added secondary electrical modes...
JAI tool installation at Ulm University
CUSTOMER STORY What problems does the Institute of Organic Chemistry II and New Materials at Ulm University solve with the JAI HPLC tool and why was it chosen? Philipp Seitz, research associate was interviewed. A very exciting conversation!
